Steven Mercurio, Ph.D.

Our PhD scientists are experienced in the leading techniques for characterizing pharmaceutical polymorphs including X-ray diffraction and thermal analysis. They also have extensive experience in other important material characterization methods such as scanning electron microscopy and laser diffraction for particle size distribution analysis. We have worked with over 100 pharmaceutical companies and their suppliers and have provided expert witness and patent prosecution services. A brief outline of the focus areas of each key person is given below. Full CVs and lists of litigation experience are available on request.

ABOUT

STAFF

Lead Scientist

William E. Mayo, Ph.D.
Steven Miller, Ph.D.

Chief Microscopist

Staff Scientist

A Fellow of the International Centre for Diffraction Data (ICDD), former editor of the X-Ray Powder Diffraction File (PDF) and the journal Powder Diffraction, Dr. Mayo is recognized as an expert in the area of X-ray powder diffraction for material analysis. He is also a former Professor of Material Science and is the founder of two X-ray diffraction-based companies.. He has worked on numerous patent litigation cases with both deposition and expert witness experience. During his academic career, he published over 135 research papers and supervised numerous PhD students.

Dr. Mercurio holds a B.S, M.S, and Ph.D. in Materials Science and has extensive experience in characterizing organic and inorganic materials by X-ray diffraction (XRD), Particle Size by Laser Diffraction (PSLD), Hardness testing, optical microscopy, X-ray Fluorescence (XRF), and Scanning Electron Microscopy (SEM).  He has a background in the processing and characterization of metals and ceramics.  Among the many projects he has worked on are identification of pharmaceutical polymorphs and excipients, thermal stability of APIs, Erionite,  corrosion products and geological materials.

Dr. Miller holds a Ph.D. in Materials Science  and has extensive experience  in characterizing organic and inorganic materials by X-ray diffraction (XRD), X-ray fluorescence (XRF) and Scanning Electron Microscopy (SEM). He has numerous publications with an emphasis on characterization of nanoscale materials. Among the many projects he has worked on are identification of pharmaceutical polymorphs and excipients, thermal stability of APIs, carbonaceous films, Asbestos, Erionite, respirable silica, trace metals, hazardous waste, corrosion products and geological materials.

18C Hornerstown Rd.

Cream Ridge, NJ  08514

412-699-0413